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Inventi Impact: Embedded Systems

Articles

  • Inventi:ees/14534/14
    Formal Specification Based Automatic Test Generation for Embedded Network Systems
    15-Oct-2014 Research 2014 : October - December
    Eun Hye Choi, Hideaki Nishihara, Takahiro Ando, Nguyen Van Tang, Masahiro Aoki, Keiichi Yoshisaka, Osamu Mizuno, Hitoshi Ohsaki

    Embedded systems have become increasingly connected and communicate with each other, forming large-scaled and complicated\nnetwork systems. To make their design and testing more reliable and robust, this paper proposes a formal specification language\ncalled SENS and a SENS-based automatic test generation tool called TGSENS. Our approach is summarized as follows: (1) A user\ndescribes requirements of target embedded network systems by logical property-based constraints using SENS. (2) Given SENS\nspecifications, test cases are automatically generated using a SAT-based solver. Filtering mechanisms to select efficient test cases are\nalso available in our tool. (3) In addition, given a testing goal by the user, test sequences are automatically extracted fromexhaustive\ntest cases.We�ve implemented our approach and conducted several experiments on practical case studies.Through the experiments,\nwe confirmed the efficiency of our approach in design and test generation of real embedded air-conditioning network systems

    How to Cite this Article
    CC Compliant Citation: Eun Hye Choi, Hideaki Nishihara,\nTakahiro Ando, et al., â??Formal Specification Based Automatic\nTest Generation for Embedded Network Systems,â? Journal of\nApplied Mathematics, vol. 2014, Article ID 909762, 21 pages,\n2014. doi:10.1155/2014/909762. Copyright © 2014 Eun Hye Choi et al.This article is distributed under the Creative Commons Attribution License,(http://creativecommons.org/licenses/by/3.0/) which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.\n
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